Algorithms and challenges of electron microscope tomography

Gregory Beylkin
University of Colorado, Boulder
Dept. of Applied Math

Specimen damage due to irradiation, limited aperture and a high level of noise rank among the most significant difficulties encountered in electron microscope tomography. It might be possible to alleviate the limited aperture and noise effects by formulating the tomography problem using bandlimited functions and associated algorithms.

We will discuss these challenges, problem formulations involving band-limited functions and associated transforms.

Presentation (PDF File)

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