Monday, November 04, 2002
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Morning Session
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8:30 - 9:30
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Check-In/Breakfast (Hosted by IPAM)
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9:30 - 10:15
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Guillermo Sapiro (University of Minnesota)
"Imaging and Nano"
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10:15 - 11:00
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Richard Kiehl (University of Minnesota)
"Image Processing Functions in Cellular Nonlinear Networks Comprised of Simple Nanoscale Elements"
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11:00 - 11:30
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Break
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11:30 - 12:15
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Peter Catrysse (Stanford University)
"Light Filters using Patterned Metal Layers in CMOS Technology"
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12:15 - 2:00
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Lunch (on your own)
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Afternoon Session
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2:00 - 3:00
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Tamas Roska (Hungarian Academy of Science)
"Cellular wave computers"
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3:00 - 3:30
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Break
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3:30 - 4:30
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Horst Haussecker (Intel)
"Quantitative Nano-Feature Analysis in Semiconductor Technology and Beyond"
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4:30 - 5:30
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Wolfgang Porod (University of Notre Dame)
"Nanotechnology for imaging: opportunities and challenges"
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5:30 - 7:00
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Wine/Cheese Reception (Hosted by IPAM)
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Tuesday, November 05, 2002
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Morning Session
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8:30 - 9:30
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Continental Breakfast
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9:30 - 10:30
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Informal Discussion
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10:30 - 11:00
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Break
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11:00 - 12:00
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Supriyo Bandyopadhyay (Virginia Commonwealth University)
"Noise in Nanostructured Systems"
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12:00 - 2:00
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Lunch (on your own)
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Afternoon Session
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2:00 - 3:00
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SukHwan Lim (Stanford University)
"CMOS Imaging: Technology & Applications"
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3:00 - 3:30
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Break
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3:30 - 4:30
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Frank Hoppensteadt (Arizona State University)
"Perturbation Methods for Systems with Parametric Noise"
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4:30 - 5:30
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DeLiang Wang (Ohio State University)
"An Oscillatory Correlation Approach to Scene Segmentation"
Presentation (PowerPoint File)
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5:30 - 6:30
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Vwani Roychowdhury (UCLA)
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Wednesday, November 06, 2002
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Morning Session
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8:30 - 9:30
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Continental Breakfast
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9:30 - 10:30
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Eli Yablonovitch (UCLA)
"The Inverse Problem in Engineering: Nano-photonics, and Nano-electronics"
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10:30 - 11:00
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Break
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11:00 - 12:00
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Martin Rumpf (University of Duisburg, Germany)
"Geometric Methods in 2D and 3D image matching "
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12:00 - 1:30
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Lunch (Hosted by IPAM)
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Afternoon Session
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1:30 - 2:00
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Achi Brandt (Weizmann Institute of Science)
"Segmentation and Boundary Detection Using Multiscale Intensity Measurements"
Presentation (PowerPoint File)
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2:00 - 3:00
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Tom Malzbender (Hewlett Packard Laboratories)
"Image-Based Surface Relighting and Enhancement"
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3:00 - 3:30
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Break
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3:30 - 4:30
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Richard Superfine (University of North Carolina)
"Nanotechnology Needs: Image analysis and graphics for control and understanding"
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4:30
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Conclusion
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