Abstract

Analysis of Random Measurements: Lecture II

Roman Vershynin
University of California, Davis (UC Davis)

Lecture 2. Upper and lower bounds for matrices with i.i.d. entries
a) The epsilon-net method revisited
b) Random processes: Dudley's inequality
c) Random processes: Slepian's inequality

Audio (MP3 File, Podcast Ready)

Back to Short Course: Sparse Representations and High Dimensional Geometry : In conjunction with the AMS 2007 Von Neumann Symposium