Statistical Optics and Free Electron Lasers

Gianluca Geloni
European XFEL

In this contribution I will review the relation between Statistical Optics and Free-Electron Laser theory. The active medium of Free-Electron Lasers is constituted by ultrarelativistic beams of electrons. In these beams, shot-noise is always present as a fundamental effect, and therefore an analysis in terms of Statistical Optics is needed to characterize the FEL system. I will underline the simplifying assumptions often made in statistical treatments and of FEL radiation, and discuss the definition of figures of merit used to describe the FEL output.

Presentation (PDF File)

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