Atomic Force Microscopy (AFM) is a versatile technique, in which it is possible to image sample surfaces in different environments, such as in liquids or controlled atmospheres, and obtain information from different types of interactions, from micro to atomic scale. In this talk, AFM basic concepts will be covered, being easily extended to other techniques belonging to the family called Scanning Probe Microscopy (SPM), with which can obtain Information on topography, electronic density, mechanical, chemical and magnetic properties, among others, often requiring simple or no preparation of the sample. Understanding the similarities and differences from data generated by SPM may inspire the application or adaptation of computational methods already widely used in other types of microscopy.
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